Products
Shikino High-Tech contributes to prompt startup of production lines – from the creation of inspection programs to the adjustment of test jigs.
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High Density 8ch precision SMU in 3U / 2Slot of PXI form factor
SHSA-101-100 / SHSA-101-50
- Maximum supply voltage ±20V.
- Maximum supply current ±100mA (SHSA-101-100) or ±50mA (SHSA-101-50).
- 4-Quadrant operation (up to 2 Watt) on each channel.
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Improved alarm funcion suitable for the inspecting system.
Most suitable for the inspecting systems for various electoronic devices.
Alarms : Oscillation / Limit / Range / GND sense / Signal guard - Including a driver VI for the LabVIEW software.
- Including a driver DLL for Windows operating system.
- Also it bundles valuable sample codes for C++ programing.
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High Performance Monitored Burn-in Systems that can
Meet Your High Throughput Manufacturing Needs.
BI-1300
BI-1400- Provides Total Integrity in Burn-in Process.
- Allows Operations in Controlled/Managed Environment.
- Monitor Functions
- High Performance Drivers
- On Line Operation
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Time Reduction
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Negative Power Supply
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Power Slow Start
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General-Purpose IC Tester for both DC and AC tests.
We Will Meet Your Testing Requirements With Our Semi-Customized Solution.
AITS-200 (Analog IC Test System)- Simultaneous Measurements of up to 4DUTs
- Constant Voltage/Current Sources of ±40V/±2A
- Function Generator Capable of Generating up to 20MHz Sine waves and Square waves,etc.
- Per-pin Architecture.
- Low cost of ownership.
- Small Footprint Requirement.
- Superior Debugging Functions.
- Self-Calibration Features.
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Low cost, Compact tester for high pin count LSIs.
Select the devices easily both before and after Burn-in.
AITS-OSL (Open-Short-Leak Test System)- Available for max.2048pin device at one measurement.
- Up to 8pcs measurement available at the same time for testing device(DUT)
- Not necessary for programming study by GUI condition setting.